Active matrix substrate and method for manufacturing the same

ABSTRACT

A thin film transistor includes: a semiconductor channel film; a gate insulating film on the semiconductor channel film; a gate electrode formed of a laminated film including a first conductive film and a second conductive film on the gate insulating film; an interlayer insulating film covering the semiconductor channel film, the gate insulating film, and the gate electrode; a source electrode formed of a laminated film including a third conductive film and a fourth conductive film formed on the interlayer insulating film; and a drain electrode formed of the third conductive film. A gate wiring is formed of the laminated film including the first conductive film and the second conductive film. A source wiring is formed of the laminated film including the third conductive film and the fourth conductive film. A pixel electrode is formed of the first conductive film. A counter electrode is formed of the third conductive film.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to an active matrix substrate used in adisplay or the like and to a method for manufacturing the active matrixsubstrate.

2. Description of the Background Art

An active matrix substrate (hereinafter referred to as a “TFTsubstrate”) that includes a thin film transistor (TFT) serving as aswitching element is widely known to be used in an electro-opticaldevice such as a liquid crystal display (LCD). The LCD including the TFTsubstrate (TFT-LCD) requires improvements on display characteristics(such as a wide viewing angle, high definition, and high quality) andalso requires low costs as a result of simplifying manufacturing stepsfor an efficient manufacturing.

The general TFT-LCD has a liquid crystal cell as the basic structure inwhich the TFT substrate (element substrate) and a counter substrate (CFsubstrate) sandwich a liquid crystal layer, and the TFT-LCD is formed ofthe liquid crystal cell including a polarizer bonded thereto. The TFTsubstrate includes a plurality of pixels in which a pixel electrode anda TFT that is connected to the pixel electrode are disposed in a matrixpattern. The counter substrate includes a color filter (CF) and acounter electrode disposed opposite to the pixel electrode. For example,a full transmissive LCD includes a backlight (BL) on a back surface sideof the liquid crystal cell.

In this manner, the liquid crystal cell including the pixel electrodeand the counter electrode for generating an electric field to drive theliquid crystals disposed so as to sandwich the liquid crystal layer is aliquid crystal cell of a vertical electric field driving method typifiedby a twisted nematic (TN) mode. The TFT substrate of the TN mode isnormally manufactured in four or five photolithography steps(photolithography processes). For example, Japanese Patent ApplicationLaid-Open No. 64-35529 (1989), Japanese Patent Application Laid-Open No.2001-311965, and Japanese Patent Application Laid-Open No. 2009-25788below disclose a manufacturing method for forming the TFT substrate inthree photolithography steps.

On the other hand, in terms of the wide viewing angle of the TFT-LCD, anin-plane switching (IPS) mode (“IPS” is a trademark) has been developed,the IPS mode being one of lateral electric field driving methodsincluding both of the pixel electrode and the counter electrode disposedon the TFT substrate. The IPS mode can obtain the viewing angle widerthan that of the vertical electric field driving method, but an imagedisplay portion has an aperture ratio and a transmittance lower thanthose of the vertical electric field driving method, so that it isdifficult to obtain bright display characteristics. This problem arisesin the situation where an electric field for driving liquid crystalsfails to operate effectively on liquid crystals in a region directlyabove the pixel electrode having a comb pattern. A fringe fieldswitching (FFS) mode has been developed as a lateral electric fielddriving method capable of improving this problem (for example, JapanesePatent Application Laid-Open No. 2001-56474).

Moreover, in terms of high definition and high quality of the TET-LCD, atechnology has been developed to use an oxide semiconductor having amobility higher than that of the conventional Si for a semiconductorserving as an active layer of the TFT formed in the TFT substrate (forexample, Japanese Patent Application Laid-Open No. 2004-103957, JapanesePatent Application Laid-Open No. 2005-77822, Japanese Patent ApplicationLaid-Open No. 2008-72011 and Nature Vol. 432 (2004) p. 488). Examples ofthe oxide semiconductor include a zinc oxide (ZnO) system and an InGaZnOsystem in which a gallium oxide (Ga₂O₃) and an indium oxide (In₂O₃) areadded to the zinc oxide (ZnO). The oxide semiconductor film haslight-transmissive properties higher than those of a Si semiconductorfilm, and Japanese Patent Application Laid-Open No. 2007-115902, forexample, discloses that an oxide semiconductor film having atransmittance of greater than or equal to 70% to visible light of 400 nmto 800 nm.

The oxide semiconductor film above can be etched with a weak acidsolution such as oxalic acid and carboxylic acid, and thus there is anadvantage that a pattern is easily processed. However, the oxidesemiconductor film is easily dissolved by an acid solution normally usedin an etching process on general metal films (Cr, Ti, Mo, Ta, Al, Cu,and alloys thereof) that are used for a source electrode and a drainelectrode of the TFT. Thus, when the metal films to be the sourceelectrode and the drain electrode are etched (patterned), it isnecessary to consider preventing the oxide semiconductor film from beingdestroyed. For example, Japanese Patent Application Laid-Open No.2005-77822 discloses a technology to add a new element to the oxidesemiconductor to improve resistance to a chemical solution and atechnology to optimize film thicknesses of the metal film and the oxidesemiconductor film to be the source electrode and the drain electrode.

The LCD of the FFS mode has excellent viewing angle characteristics andpanel transmittance, whereby demand is on the increase. However, the TFTsubstrate used for the LCD of the FFS mode requires both of the pixelelectrode and the counter electrode (common electrode) to be formed onthe TFT substrate, thereby increasing the number of wire layers of theTFT substrate. This increases the number of photolithography stepsrequired for forming the TFT substrate, which causes an increase inmanufacturing costs.

For example, the TFT substrate of the general FFS-LCD disclosed in FIGS.1 and 3 of Japanese Patent Application Laid-Open No. 2001-56474 ismanufactured in six photolithography steps. As described above, themanufacturing method that requires the three photolithography steps forthe TFT substrate of the conventional TN mode has been developed, andthus reducing the number of photolithography steps is a major challengein manufacturing the TFT substrate of the FFS mode.

To solve the problem, Japanese Patent Application Laid-Open No.2001-235763 and Japanese Patent Application Laid-Open No. 2009-157366disclose a method to reduce the photolithography steps to four or fivetimes in manufacturing the TFT substrate of the FFS mode. However, thenumber of photolithography steps is still great compared to themanufacture of the TFT substrate of the TN mode, whereby an increase inthe manufacturing costs is inevitable.

Furthermore, as described above, the general oxide semiconductor film iseasily dissolved by the acid solution used for etching the metal films(Cr, Ti, Mo, Ta, Al, Cu, and alloys thereof) that are used for thesource electrode and the drain electrode of the TFT. The general oxidesemiconductor is difficult to be used in a case of the structureexposing a lower layer of the semiconductor film upon the etchingprocess on the source electrode and the drain electrode, as with thestructure of the TFT in Japanese Patent Application Laid-Open No.2001-56474 (FIGS. 1 and 3), Japanese Patent Application Laid-Open No.2001-235763 (FIG. 3), and Japanese Patent Application Laid-Open No.2009-157366 (FIG. 5).

SUMMARY OF THE INVENTION

It is an object of the present invention to provide an active matrixsubstrate of an FFS mode capable of easily using an oxide semiconductorfilm as a semiconductor channel film of a TFT and suppressing the numberof photolithography steps during manufacturing.

An active matrix substrate of the present invention includes: asubstrate; a thin film transistor formed on the substrate; a gate wireconnected to a gate electrode of the thin film transistor; a source wireconnected to a source electrode of the thin film transistor; a pixelelectrode connected to a drain electrode of the thin film transistor; acounter electrode disposed opposite to the pixel electrode; and a commonwire supplying the counter electrode with a specified voltage.

The thin film transistor includes: a semiconductor channel film that isformed on the substrate and is formed of a semiconductor film; and agate insulating film that is formed on the semiconductor channel filmand is formed of a first insulating film. The gate electrode of the thinfilm transistor is formed of a laminated film including a firstconductive film and a second conductive film on the first conductivefilm formed on the gate insulating film. An interlayer insulating filmis formed on the semiconductor channel film, the gate insulating film,and the gate electrode and is formed of a second insulating film. Thesource electrode of the thin film transistor is formed of a laminatedfilm including a third conductive film and a fourth conductive film onthe third conductive film formed on the interlayer insulating film andis connected to the semiconductor channel film through a contact holeformed in the interlayer insulating film and the gate insulating film.The drain electrode of the thin film transistor is formed of the thirdconductive film and is connected to the semiconductor channel filmthrough a contact hole formed in the interlayer insulating film and thegate insulating film.

The gate wire is formed of the laminated film including the firstconductive film and the second conductive film and is formed to beconnected to the gate electrode. The source wire is formed of thelaminated film including the third conductive film and the fourthconductive film and is formed to be connected to the source electrode.The pixel electrode is formed of the first conductive film and isconnected to the drain electrode through a contact hole formed in theinterlayer insulating film. The counter electrode is formed of the thirdconductive film and formed on the pixel electrode via the interlayerinsulating film.

The present invention can suppress the number of photolithography stepsin manufacturing the active matrix substrate of the FFS mode includingthe TFT, allowing for an improvement in productivity, which results in areduction in manufacturing costs. Furthermore, the oxide semiconductorhaving a high mobility can be used for the semiconductor channel film ofthe TFT, which can also contribute to high definition and highperformance of the active matrix substrate.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a plan view showing a configuration of a TFT substrateaccording to first, second and fourth preferred embodiments;

FIG. 2 is a plan view of the TFT substrate according to the firstpreferred embodiment;

FIG. 3 is a cross-sectional view of the TFT substrate according to thefirst preferred embodiment;

FIGS. 4 to 6 are process diagrams in plan view showing a method formanufacturing the TFT substrate according to the first preferredembodiment;

FIGS. 7 to 9 are process diagrams in cross section showing the methodfor manufacturing the TFT substrate according to the first preferredembodiment;

FIG. 10 is a cross-sectional view showing a TFT substrate according to amodification of the first preferred embodiment;

FIG. 11 is a plan view showing a TFT substrate according to the secondpreferred embodiment;

FIG. 12 is a cross-sectional view showing the TFT substrate according tothe second preferred embodiment;

FIGS. 13 and 14 are process diagrams in plan view showing a method formanufacturing the TFT substrate according to the second preferredembodiment;

FIGS. 15 to 22 are process diagrams in cross section showing the methodfor manufacturing the TFT substrate according to the second preferredembodiment;

FIG. 23 is a diagram showing spectral characteristics of a transmittanceof semiconductor films used in the TFT substrate according to the secondpreferred embodiment;

FIG. 24 is a cross-sectional view showing a TFT substrate according to amodification of the second preferred embodiment;

FIG. 25 is a plan view showing a configuration of a TFT substrateaccording to a third preferred embodiment;

FIG. 26 is a plan view of the TFT substrate according to the thirdpreferred embodiment;

FIG. 27 is a cross-sectional view of the TFT substrate according to thethird preferred embodiment;

FIGS. 28 and 29 are process diagrams in plan view showing a method formanufacturing the TFT substrate according to the third preferredembodiment;

FIGS. 30 and 31 are process diagrams in cross section showing the methodfor manufacturing the TFT substrate according to the third preferredembodiment;

FIG. 32 is a cross-sectional view showing a TFT substrate according to amodification of the third preferred embodiment;

FIG. 33 is a plan view of a TFT substrate according to the fourthpreferred embodiment;

FIG. 34 is a cross-sectional view of the TFT substrate according to thefourth preferred embodiment;

FIGS. 35 and 36 are process diagrams in plan view showing a method formanufacturing the TFT substrate according to the fourth preferredembodiment;

FIGS. 37 and 38 are process diagrams in cross section showing the methodfor manufacturing the TFT substrate according to the fourth preferredembodiment;

FIG. 39 is a cross-sectional view showing a TFT substrate according to amodification of the fourth preferred embodiment;

FIG. 40 is a plan view showing the TFT substrate according to themodification of the fourth preferred embodiment; and

FIG. 41 is a cross-sectional view of a TFT substrate according to amodification in which a planarizing film is applied to an interlayerinsulating film of the TFT substrate according to the fourth preferredembodiment.

DESCRIPTION OF THE PREFERRED EMBODIMENTS First Preferred Embodiment

FIG. 1 is a plan view showing a configuration of a TFT substrateaccording to a first preferred embodiment. The TFT substrate of thefirst preferred embodiment is an active matrix substrate including aplurality of TFTs serving as switching elements disposed in a matrixpattern. An example of the TFT substrate for a full transmissive LCD isgiven for a description here.

A TFT substrate 200 can be divided into a display region 202 in which aplurality of pixels 204 including a TFT 201 and a pixel electrode 7 aredisposed in a matrix pattern and a frame region 203 surrounding thedisplay region 202.

The display region 202 includes a plurality of gate wires 41 (scanningsignal lines) and a plurality of source wires 51 (display signal lines)disposed therein. The plurality of gate wires 41 are disposed inparallel to each other, and the plurality of source wires 51 are alsodisposed in parallel to each other. The plurality of gate wires 41 andthe plurality of source wires 51 intersect each other. In FIG. 1, thegate wires 41 extend in a horizontal direction, and the source wires 51extend in a vertical direction. Regions surrounded by the adjacent gatewires 41 and the adjacent source wires 51 are the pixels 204, so thatthe pixels 204 are disposed in the matrix pattern in the display region202

FIG. 1 shows the one representative pixel 204 that is enlarged. Thepixel 204 includes at least one of the TFTs 201 disposed therein. TheTFT 201 is disposed near the intersection of the gate wire 41 and thesource wire 51. The TFT 201 includes a gate electrode connected to thegate wire 41, a source electrode connected to the source wire 51, and adrain electrode connected to the pixel electrode 7.

Meanwhile, the frame region 203 of the TFT substrate 200 includes ascanning signal driving circuit 205 and a display signal driving circuit206 provided therein. The gate wires 41 are drawn from the displayregion 202 to the frame region 203 on the side where the scanning signaldriving circuit 205 is provided, to thereby be connected to the scanningsignal driving circuit 205, which is omitted from the diagram.Similarly, the source wires 51 are drawn from the display region 202 tothe frame region 203 on the side where the display signal drivingcircuit 206 is provided, to thereby be connected to the display signaldriving circuit 206.

An external wire 207 for connecting the scanning signal driving circuit205 to the outside is disposed near the scanning signal driving circuit205. An external wire 208 for connecting the display signal drivingcircuit 206 to the outside is disposed near the display signal drivingcircuit 206. The external wire 207 and the external wire 208 are wiresubstrates such as a flexible printed circuit (FPC).

The scanning signal driving circuit 205 is supplied with various controlsignals from the outside through the external wire 207. The displaysignal driving circuit 206 is supplied with various control signals andimage data from the outside through the external wire 208. The scanningsignal driving circuit 205 supplies the gate wires 41 with a gate signal(scanning signal) based on the control signal from the outside. The gatewires 41 are selected in turn at regular intervals by the controlsignal. The display signal driving circuit 206 supplies the source wires51 with a display signal in response to the image data based on thecontrol signal from the outside. The operations of the scanning signaldriving circuit 205 and the display signal driving circuit 206 supplyeach pixel 204 with a display voltage in response to the display signal.

In addition, it is not restrictive that the scanning signal drivingcircuit 205 and the display signal driving circuit 206 are formed on theTFT substrate 200. The scanning signal driving circuit 205 and thedisplay signal driving circuit 206 may be configured to include a tapecarrier package (TCP) and be connected to the TFT substrate 200.

The TFT 201 functions as a switching element for supplying the pixelelectrode 7 with the display voltage, and the gate signal supplied tothe gate electrode from the gate wire 41 controls the TFT 201 to turn onand off. Upon the TFT 201 turning on, the display voltage supplied tothe source wire 51 is applied to the pixel electrode 7 through the TFT201. The pixel 204 includes a common electrode 9 that is supplied with aspecified voltage (common voltage) through a common wire 91 and acounter electrode 8 that is connected to the common electrode 9 and isdisposed opposite to the pixel electrode 7, and an electric field inresponse to the display voltage is generated between the pixel electrode7 and the counter electrode 8 (the counter electrode 8 and the commonelectrode 9 are at the same potential, so that the counter electrode 8is omitted from FIG. 1). A holding capacitor 209 formed between thepixel electrode 7 and the common electrode 9 holds the display voltageapplied to the pixel electrode 7 for a fixed time during displaying animage of one frame. In this preferred embodiment, the common wires 91are disposed to extend in parallel to the gate wires 41.

In a case of a liquid crystal display (LCD), a counter substrate (notshown) is disposed so as to be opposite to the TFT substrate 200. Thecounter substrate is, for example, a color filter (CF) substrate and isdisposed on the front surface side (visible side). A color filter, ablack matrix (BM), an alignment film, or the like is formed on thecounter substrate. The alignment film may be formed on a surface of theTFT substrate 200. In a case of the LCD of a lateral electric fielddrive mode such as an FFS mode, the common electrode 9 is disposed onthe TFT substrate 200 instead of the counter substrate.

The TFT substrate 200 and the counter substrate are bonded with acertain gap (cell gap) therebetween, and liquid crystals are injectedinto the gap and sealed, thereby forming a liquid crystal display panel.In other words, the liquid crystal display panel has a structuresandwiching the liquid crystal layer between the TFT substrate 200 andthe counter substrate. Moreover, a polarizing plate, a phase differenceplate, or the like is provided on an outer surface of the liquid crystaldisplay panel. The LCD includes a backlight (BL) unit or the likedisposed on a back surface side of the liquid crystal display panel (ona back side of the TFT substrate 200).

A simple description is given here of an operation of the LCD. Theliquid crystals sandwiched between the TFT substrate 200 and the countersubstrate are driven by the electric field generated between the pixelelectrode 7 and the counter electrode 8 (alignment directions of theliquid crystals are controlled). When the alignment directions of theliquid crystals are changed, a polarization state of light passingthrough the liquid crystals is changed. Specifically, the polarizingplate on the TFT substrate 200 side causes the light from the backlightunit disposed on the back surface side of the liquid crystal displaypanel to be a linearly polarized light. Then, the linearly polarizedlight is passed through the liquid crystal layer, thereby changing thepolarization state.

After the light is passed through the liquid crystal layer, thepolarization state changes the amount of light passing through thepolarizing plate on the counter substrate side. In other words, of thetransmitted light that is transmitted through the liquid crystal displaypanel from the backlight unit, the amount of light passing through thepolarizing plate on the visible side is changed. The alignmentdirections of the liquid crystals are changed by the display voltageapplied to the pixel electrode 7. Therefore, the control of the displayvoltage controls the amount of light passing through the polarizingplate on the visible side. In the liquid crystal display, the displayvoltage applied to each pixel is controlled based on the display data,to thereby display a desirable image.

Next, with reference to FIGS. 2 and 3, a more detailed configuration ofthe TFT substrate 200 according to the first preferred embodiment willbe described. FIG. 2 is a diagram showing a planar configuration of amain part including the pixel 204 in the TFT substrate 200 of the FFSmode, and FIG. 3 is a cross-sectional configuration thereof. FIG. 3shows corresponding cross sections taken along an X1-X2 line, a Y1-Y2line, and a Z1-Z2 line shown in FIG. 2.

The cross section taken along the X1-X2 line corresponds to a region(pixel portion) for forming the pixel 204. The cross section of thepixel portion shown in FIG. 3 includes a “TFT portion” that is a regionfor forming the TFT 201 and an “image display portion” that is a regionfor forming the pixel electrode 7 and the counter electrode 8.

The cross section taken along the Y1-Y2 line corresponds to a region(gate terminal portion) for forming a gate terminal 42 that supplies thegate wires 41 with the gate signal and a gate terminal pad 43 that isprovided on the gate terminal 42. The cross section taken along theZ1-Z2 line corresponds to a region (source terminal portion) for forminga source terminal 52 that applies the display signal to the source wires51 and a source terminal pad 53 that is provided on the source terminal52. The gate terminal 42 and the gate terminal pad 43 are provided at anend portion of the gate wire 41, and the source terminal 52 and thesource terminal pad 53 are provided at an end portion of the source wire51.

The TFT substrate 200 is formed to include a substrate 1 that is atransparent insulating substrate made of glass, for example. Alight-transmissive semiconductor film 2 that forms an active layer(channel layer) of the TFT 201 (hereinafter, the semiconductor film inthe TFT portion is referred to as a “semiconductor channel film”) and agate insulating film 31 that is formed on the semiconductor channel film2 and is formed of a first insulating film are disposed on the substrate1 of the TFT portion In the pixel portion. Moreover, a gate electrode 4is formed on the gate insulating film 31. The gate electrode 4 has alaminated structure including a gate electrode lower layer portion 4 aformed of a first conductive film and a gate electrode upper layerportion 4 b formed of a second conductive film.

Similarly to the gate electrode 4, the gate wire 41 also has a laminatedstructure including a gate wire lower layer portion 41 a formed of thefirst conductive film and a gate wire upper layer portion 41 b formed ofthe second conductive film, which is not shown in FIG. 3. The gate wires41 are formed on the substrate 1 so as to extend in the horizontaldirection of FIG. 2. The gate electrode 4 is connected to the gate wires41 (integrally formed with the gate wires 41). In other words, part ofthe gate wires 41 functions as the gate electrode 4, and the portionthat branches off from the gate wires 41 and extends to the TFT portionforms the gate electrode 4 in the example of FIG. 2.

The pixel electrode 7 is formed on the substrate 1 of the image displayportion. In the first preferred embodiment, the pixel electrode 7 is aflat plate-shaped electrode formed of the first conductive film and isindividually formed in each pixel 204.

Furthermore, the common electrode 9 is formed on the substrate 1 in thepixel portion. The common electrode 9 has a laminated structureincluding a common electrode lower layer portion 9 a formed of the firstconductive film and a common electrode upper layer portion 9 b formed ofthe second conductive film.

Similarly to the common electrode 9, the common wire 91 also has alaminated structure including a common wire lower layer portion 91 aformed of the first conductive film and a common wire upper layerportion 91 b formed of the second conductive film, which is not shown inFIG. 3. In the first preferred embodiment, the common wires 91 areformed on the substrate 1 so as to extend in parallel to the gate wires41. The common electrode 9 is connected to the common wires 91(integrally formed with the common wires 91). In other words, part ofthe common wires 91 functions as the common electrode 9, and the wideportion of the common wires 91 that overlaps the counter electrode 8forms the common electrode 9 in the example of FIG. 2.

Meanwhile, the gate terminal 42 formed of the first conductive film isformed on the substrate 1 in the gate terminal portion. Moreover, thesource terminal 52 formed of the first conductive film is formed on thesubstrate 1 in the source terminal portion.

An interlayer insulating film 32 (not shown in FIG. 2) formed of thesecond insulating film is formed entirely on the substrate 1 so as tocover the gate electrode 4, the gate wires 41, the pixel electrode 7,the common electrode 9, the common wires 91, the gate terminal 42, andthe source terminal 52. Contact holes 11 to 16 are formed in theinterlayer insulating film 32.

The contact hole 11 (source region contact hole) penetrates theinterlayer insulating film 32 and the gate insulating film 31 to reach aportion of the semiconductor channel film 2, the portion being a sourceregion of the TFT 201. The contact hole 12 (drain region contact hole)penetrates the interlayer insulating film 32 and the gate insulatingfilm 31 to reach a portion of the semiconductor channel film 2, theportion being a drain region of the TFT 201. In other words, the contacthole 11 and the contact hole 12 are formed at the positions thatsandwich the gate electrode 4. The contact hole 13 (pixel electrodecontact hole) penetrates the interlayer insulating film 32 to reach thepixel electrode 7. The contact hole 14 (common electrode contact hole)penetrates the interlayer insulating film 32 to reach the commonelectrode 9. The contact hole 15 (gate terminal contact hole) penetratesthe interlayer insulating film 32 to reach the gate terminal 42. Thecontact hole 16 (source terminal contact hole) penetrates the interlayerinsulating film 32 to reach the source terminal 52.

A source electrode 5 and a drain electrode 6 of the TFT 201 are formedon the interlayer insulating film 32 of the TFT portion in the pixelportion. The source electrode 5 has a laminated structure including asource electrode lower layer portion 5 a formed of a third conductivefilm and a source electrode upper layer portion 5 b formed of a fourthconductive film. The source electrode 5 is connected to thesemiconductor channel film 2 through the contact hole 11. The drainelectrode 6 has a single-layer structure including the third conductivefilm. The drain electrode 6 is connected to the semiconductor channelfilm 2 through the contact hole 12 and is also connected to the pixelelectrode 7 through the contact hole 13.

Moreover, similarly to the source electrode 5, the source wire 51 has alaminated structure including a source wire lower layer portion 51 aformed of the third conductive film and a source wire upper layerportion 51 b formed of the fourth conductive film. The source wires 51are formed on the interlayer insulating film 32 so as to extend in thevertical direction, and the source electrode 5 is connected to thesource wires 51 (integrally formed with the source wires 51). In otherwords, part of the source wires 51 functions as the source electrode 5,and the portion that branches off from the source wires 51 and extendsto the TFT portion forms the source electrode 5 in the example of FIG.2.

The counter electrode 8 formed of the third conductive film is disposedon the interlayer insulating film 32 of the image display portion so asto be opposite to the pixel electrode 7. In the first preferredembodiment, the counter electrode 8 is an electrode having a combpattern or a grid pattern having slits, and the counter electrode 8 isconnected to the common electrode 9 through the contact hole 14.

Meanwhile, the gate terminal pad 43 formed of the third conductive filmis formed on the interlayer insulating film 32 in the gate terminalportion. Moreover, the source terminal pad 53 formed of the thirdconductive film is formed on the interlayer insulating film 32 in thesource terminal portion. The gate terminal pad 43 is connected to thegate terminal 42 through the contact hole 15, and the source terminalpad 53 is connected to the source terminal 52 through the contact hole16. The gate terminal pad 43 is supplied with the scanning signal fromthe scanning signal driving circuit 205 shown in FIG. 1, and the sourceterminal pad 53 is supplied with the display signal from the displaysignal driving circuit 206 shown in FIG. 1.

Next, a method for manufacturing the TFT substrate 200 according to thefirst preferred embodiment will be described with reference to FIGS. 4to 9. FIGS. 4 to 6 are process diagrams in plan view showing each stepof the method for manufacturing the TFT substrate 200. FIGS. 7 to 9 areprocess diagrams in cross section showing each step of the method formanufacturing the TFT substrate 200. In addition, FIGS. 4 to 6 are planviews corresponding to FIGS. 7 to 9, respectively. In FIGS. 4 to 9, thesame components corresponding to those shown in FIGS. 2 and 3 aredenoted by the same references.

First, the surface of the substrate 1 is cleaned with cleaning liquid orpure water. Here, a glass substrate having a thickness of 0.6 mm is usedas the substrate 1. A laminated film including the semiconductor filmbeing the material for the semiconductor channel film 2 of the TFT 201and the first insulating film being the material for the gate insulatingfilm 31 laminated in the stated order is formed on the substrate 1 thathas been cleaned. In this preferred embodiment, an oxide semiconductorof an InGaZnO system (InGaZnO film) in which a gallium oxide (Ga₂O₃) anda zinc oxide (ZnO) are added to an indium oxide (In₂O₃) is used as thesemiconductor film. A silicon oxide (SiO) is used as the firstinsulating film.

The InGaZnO film can be formed by a DC sputtering method with a InGaZnOtarget [In₂O₃.(Ga₂O₃).(ZnO)₂] in which an atomic composition ratio ofIn:Ga:Zn:O is 1:1:1:4. An argon (Ar) gas, a krypton (Kr) gas, or thelike can be used as a sputtering gas. At this time, the sputtering withonly the Ar gas or the Kr gas normally forms an oxide film that has theatomic composition ratio of oxygen less than a stoichiometry compositionand is in a state of lacking in oxygen ions (composition ratio of O isless than 4 in the example above). Thus, it is desirable to mix the Argas with an oxygen (O₂) gas to perform the sputtering. Here, a mixturegas in which the O₂ gas having the partial pressure ratio of 10% to theAr gas is added to the Ar gas is used to perform the sputtering, and theInGaZnO film having a thickness of 50 nm is formed, to thereby form thesemiconductor film. The InGaZnO film has an amorphous structureimmediately after being formed.

The SiO film can be formed by a plasma chemical vapor deposition (CVD)method with a silane (SiH₄) gas and a nitrous oxide (N₂O) gas. Here, theSiO film is formed to have a thickness of 300 nm, to thereby form thefirst insulating film.

Subsequently, a first photolithography step processes a photoresist toform a photoresist pattern, and the laminated film including thesemiconductor film and the first insulating film is patterned by etchingwith the photoresist pattern as a mask, to thereby form thesemiconductor channel film 2 and the gate insulating film 31. In thispreferred embodiment, first, the first insulating film (SiO film) isetched by a dry etching method with sulfur hexafluoride (SF₆) gas andthe O₂ gas, and then the semiconductor film (InGaZnO film) is etchedwith a chemical solution of oxalic acid. Subsequently, the photoresistpattern is separated and removed with a photoresist removing liquid ofan amine, to thereby form the laminated structure including thesemiconductor channel film 2 and the gate insulating film 31 on thesubstrate 1 as shown in FIGS. 4 and 7.

Next, a laminated film being the material for the gate electrode 4, thepixel electrode 7, and the common electrode 9 and including the firstconductive film and the second conductive film laminated in the statedorder is formed on the substrate 1. In this preferred embodiment, alight-transmissive ITO film formed of the indium oxide (In₂O₃) and a tinoxide (SnO₂) is used as the first conductive film, and an aluminum (Al)alloy film of metal, and more specifically, an alloy metal in which Niof 3 mol % is added to Al (Al-3 mol % Ni film) is used as the secondconductive film.

The ITO film can be formed by the sputtering method with an ITO target.Here, the ITO film is formed to have a thickness of 100 nm, to therebyform the first conductive film. An indium zinc oxide (InZnO) or the likeexcept for the ITO can be used as the first conductive film.

The Al-3 mol % Ni film can be formed by the sputtering method with aAl-3 mol % Ni alloy target. Here, the Al-3 mol % Ni film having athickness of 200 nm is formed, to thereby form the second conductivefilm. In addition, the Ar gas or the Kr gas can be used as thesputtering gas.

Subsequently, a second photolithography step forms a photoresistpattern, and the first conductive film and the second conductive filmare patterned by etching with the photoresist pattern as a mask, tothereby form the gate electrode 4, the gate wires 41, the pixelelectrode 7, the common electrode 9, the common wires 91, the gateterminal 42, and the source terminal 52. In this preferred embodiment,the second conductive film (Al-3 mol % Ni film) is etched with achemical solution of phosphoric acid+acetic acid+nitric acid (PAN), andthen the first conductive film (ITO film) is etched with the chemicalsolution of oxalic acid.

In this step, with the application of a half-tone exposure technique(described in detail below), the second conductive film is removed fromeach region for forming the pixel electrode 7, the gate terminal 42, andthe source terminal 52, and the second conductive film remains in eachregion for forming the gate electrode 4, the gate wires 41, the commonelectrode 9, and the common wires 91.

In other words, the half-tone exposure technique forms a photoresistpattern including a thin first photoresist portion that covers eachregion for forming the pixel electrode 7, the gate terminal 42, and thesource terminal 52 and a thick second photoresist portion that coverseach region for forming the gate electrode 4, the gate wires 41, thecommon electrode 9, and the common wires 91, to thereby remove the firstconductive film and the second conductive film by etching with thephotoresist pattern as a mask. Consequently, each pattern is formed forthe gate electrode 4, the gate wires 41, the pixel electrode 7, thecommon electrode 9, the common wires 91, the gate terminal 42, and thesource terminal 52. Then, the thickness of the photoresist pattern isreduced by ashing to remove the first photoresist portion, and thesecond conductive film is removed by etching with the remaining portionof the second photoresist portion as a mask. This removes the secondconductive film from the upper portions of the pixel electrode 7, thegate terminal 42, and the source terminal 52.

Subsequently, the photoresist pattern is separated and removed with thephotoresist removing liquid of the amine, to thereby form the gateelectrode 4, the gate wires 41, the pixel electrode 7, the commonelectrode 9, the common wires 91, the gate terminal 42, and the sourceterminal 52 as shown in FIGS. 5 and 8. The half-tone exposure techniqueallows the gate electrode 4, the gate wires 41, the common electrode 9,and the common wires 91 to have the laminated structure including thefirst conductive film and the second conductive film while the half-toneexposure technique allows the pixel electrode 7, the gate terminal 42,and the source terminal 52 to have the single-layer structure includingthe first conductive film. The gate electrode 4 and the gate wires 41have the laminated structure including the ITO film and the Al-3 mol %Ni film, whereby the gate wire resistance can be reduced and a largepanel having the increasing wire resistance particularly caused by along wire length can be handled.

As described above, the first conductive film (ITO film) and the secondconductive film (Al-3 mol % Ni film) are etched with the chemicalsolution of the oxalic acid and the acid chemical solution of the PAN,respectively. Upon the etching step, the gate insulating film 31 beingthe first insulating film (SiO film) covers the semiconductor channelfilm 2 (InGaZnO film) for protection. This prevents the semiconductorchannel film 2 from being etched, thereby being kept in an excellentpattern shape.

Moreover, the first insulating film forming the gate insulating film 31has the single-layer structure including the SiO film here, and thefirst insulating film may have the laminated structure further includingthe insulating film provided on the SiO film. The upper layer of theinsulating film may be the SiO film and may also be the insulating filmformed of the other material such as silicon nitride (SiN). The firstinsulating film has the laminated structure, allowing for the greatercoverage as a protective film.

Next, the second insulating film being the material for the interlayerinsulating film 32 is formed entirely on the substrate 1. In thispreferred embodiment, the SiO film is formed to have the thickness of300 nm by the chemical vapor deposition (CVD) method, to thereby formthe interlayer insulating film 32. In addition, the second insulatingfilm forming the interlayer insulating film 32 may also have thelaminated structure similarly to the first insulating film.

After that, a third photolithography step forms a photoresist pattern,and the interlayer insulating film 32 and the gate insulating film 31are etched with the photoresist pattern as a mask, to thereby form thecontact holes 11 to 16. This preferred embodiment uses the dry etchingmethod with the sulfur hexafluoride (SF₆) and the O₂ gas. Subsequently,the photoresist pattern is separated and removed with the photoresistremoving liquid of the amine. As a result, as shown in FIGS. 6 and 9,the contact hole 11 and the contact hole 12 reaching the semiconductorchannel film 2, the contact hole 13 reaching the pixel electrode 7, thecontact hole 14 reaching the common electrode 9, the contact hole 15reaching the gate terminal 42, and the contact hole 16 reaching thesource terminal 52 are formed.

Then, a laminated film including the third conductive film and thefourth conductive film laminated in the stated order is formed on theinterlayer insulating film 32 including the inside of the contact holes11 to 16. In this preferred embodiment, the light-transmissive ITO filmis formed to have the thickness of 100 nm as the third conductive film,and the Al-3 mol % alloy film is formed to have the thickness of 200 nmas the fourth conductive film.

After that, a fourth photolithography step forms a photoresist pattern,and the third conductive film and the fourth conductive film arepatterned by etching with the photoresist pattern as a mask, to therebyform the source electrode 5, the source wires 51, the drain electrode 6,the counter electrode 8, the gate terminal pad 43, and the sourceterminal pad 53. In this preferred embodiment, the third conductive film(ITO film) is etched with the chemical solution of the oxalic acid, andthe fourth conductive film (Al-3 mol % Ni film) is subsequently etchedwith the chemical solution of the PAN. Also in this step, with theapplication of the half-tone exposure technique, the fourth conductivefilm is removed from each region for forming the drain electrode 6, thecounter electrode 8, the gate terminal pad 43, and the source terminalpad 53, and the fourth conductive film remains in each region forforming the source electrode 5 and the source wires 51.

In other words, the half-tone exposure technique forms a photoresistpattern including a thin first photoresist portion that covers eachregion for forming the drain electrode 6, the counter electrode 8, thegate terminal pad 43, and the source terminal pad 53 and a thick secondphotoresist portion that covers each region for forming the sourceelectrode 5 and the source wires 51, to thereby remove the thirdconductive film and the fourth conductive film by etching with thephotoresist pattern as a mask. Consequently, each pattern is formed forthe drain electrode 6, the source electrode 5, the source wires 51, thecounter electrode 8, the gate terminal pad 43, and the source terminalpad 53. Then, the thickness of the photoresist pattern is reduced byashing to remove the first photoresist portion, and the fourthconductive film is removed by etching with the remaining portion of thesecond photoresist portion as a mask. This removes the fourth conductivefilm from the upper portions of the drain electrode 6, the counterelectrode 8, the gate terminal pad 43, and the source terminal pad 53.

The photoresist pattern is then separated and removed with thephotoresist removing liquid of the amine to form the source electrode 5,the source wires 51, the drain electrode 6, the counter electrode 8, thegate terminal pad 43, and the source terminal pad 53, to thereby formthe TFT substrate 200 having the configuration shown in FIGS. 2 and 3.The half-tone exposure technique allows the source electrode 5 and thesource wires 51 to have the laminated structure including the thirdconductive film and the fourth conductive film, and the half-toneexposure technique allows the drain electrode 6, the counter electrode8, the gate terminal pad 43, and the source terminal pad 53 to have thesingle-layer structure including the third conductive film.

In this manner, the drain electrode 6 and the counter electrode 8 areformed to have the single-layer structure including the ITO film,whereby the light-transmissive region of the image display portion,namely, an aperture ratio can be increased. The gate terminal pad 43 andthe source terminal pad 53 are formed of the ITO film being the oxideconductive film, and thus connection characteristics when a wiresubstrate such as an FPC for inputting a scanning signal or a displaysignal from the outside is connected to (mounted on) a terminal portioncan be improved, and reliability can thus be improved.

On the other hand, the source electrode 5 and the source wires 51 havethe laminated structure including the ITO film and the Al-3 mol % Nifilm, whereby the source wire resistance can be reduced and the largepanel having the increasing wire resistance particularly caused by thelong wire length can be handled.

As described above, the TFT substrate 200 of the first preferredembodiment shown in FIGS. 2 and 3 can be formed in the fourphotolithography steps with great productivity.

Upon assembly of the liquid crystal display panel, an alignment film andspacers are formed on the surface of the TFT substrate 200 that has beencompleted. The alignment film is a film that aligns liquid crystals andis made of polyimide or the like. The counter substrate that has beenformed separately and includes the color filter and the alignment filmis bonded to the TFT substrate 200. At this time, the spacers create gapbetween the TFT substrate 200 and the counter substrate. The liquidcrystals are injected into the gap and sealed, to thereby form theliquid crystal display panel. In the end, the polarizing plate, thephase difference plate, and the backlight unit are disposed on the outerside of the liquid crystal display panel, to thereby complete the LCD ofthe FFS mode.

In the TFT substrate 200 of the first preferred embodiment, thesemiconductor channel film 2 of the TFT 201 is disposed in the lowestlayer, so that the light from the backlight unit is directly incident onthe semiconductor channel film 2. In a case where the semiconductorchannel film 2 is the Si film, ON/OFF ratio, which is one of TFTcharacteristics, may degrade due to photocarrier generation, but thedegradation in the ON/OFF ratio can be suppressed if the semiconductorchannel film 2 is made of the oxide semiconductor as in this preferredembodiment. Therefore, the liquid crystal display device having a highcontrast ratio and a high display quality without display unevenness canbe realized.

Moreover, the semiconductor channel film 2 made of the oxidesemiconductor allows for a high mobility of the TFT 201, whereby the TFTsubstrate 200 with high operation speed can be obtained. Therefore, theTFT can be reduced in size, and the aperture ratio of the image displayportion can be increased. This enables a display at high luminance evenwith the reduced emitting light from the backlight unit, which can alsocontribute to a reduction in power consumption.

Modification of First Preferred Embodiment

FIG. 10 is a cross-sectional view showing a TFT substrate 200 accordingto a modification of the first preferred embodiment. The first preferredembodiment described above exemplifies the transmissive TFT substrate200 in which the light passes through the whole pixel electrode 7. Asshown in FIG. 10, a reflective pixel electrode 71 that reflects light isprovided in a fixed area on the pixel electrode 7, whereby thesemi-transmissive TFT substrate 200 can also be manufactured.

The reflective pixel electrode 71 is formed of the same secondconductive film (metal film such as the Al-3 mol % Ni film) as that ofthe gate electrode upper layer portion 4 b of the gate electrode 4, sothat a manufacturing step is not increased. In other words, upon theformation of the pixel electrode 7 in the second photolithography step,with the application of the half-tone exposure technique, the secondconductive film remains on part of the region for forming the pixelelectrode 7 similar to the region for forming the gate electrode 4 andthe gate wires 41, and thus the second conductive film on part of theregion for forming the pixel electrode 7 can be the reflective pixelelectrode 71.

Changing the area or the shape of the pattern of the reflective pixelelectrode 71 formed on the pixel electrode 7 can arbitrarily set theratio of the transmitted light and the reflected light of thesemi-transmissive electrode. Moreover, if the reflective pixel electrode71 is formed on almost the entire surface of the pixel electrode 7, thefull reflective TFT substrate 200 can be manufactured.

Second Preferred Embodiment

The first preferred embodiment shows the method for forming the TFTsubstrate 200 of the FFS mode in at least the four photolithographysteps, the TFT substrate 200 of the FFS mode having the configurationthat can easily apply, to the semiconductor film (semiconductor channelfilm) serving as the channel layer of the TFT, the oxide semiconductorfilm with poor resistance to acid chemical solution. A second preferredembodiment shows a method for forming a TFT substrate 200 having almostthe same configuration as that above in at least three photolithographysteps.

FIG. 11 is a diagram showing a planar configuration of a main partincluding the pixel 204 in the TFT substrate 200 according to the secondpreferred embodiment, and FIG. 12 is a cross-sectional configurationthereof. FIG. 12 shows corresponding cross sections taken along an X1-X2line, a Y1-Y2 line, and a Z1-Z2 line shown in FIG. 11. In FIGS. 11 and12, the components having the same functions as those described in thefirst preferred embodiment (FIGS. 2 and 3) are denoted by the samereferences, which are not described here. The TFT substrate 200 has thewhole configuration similar to that in the first preferred embodiment(FIG. 1).

The cross section taken along the X1-X2 line in FIG. 12 corresponds tothe region (pixel portion) for forming the pixel 204 and includes the“TFT portion” that is the region for forming the TFT 201 and the “imagedisplay portion” that is the region for forming the pixel electrode 7and the counter electrode 8. The cross section taken along the Y1-Y2line corresponds to the region (gate terminal portion) for forming thegate terminal 42 and the gate terminal pad 43, and the cross sectiontaken along the Z1-Z2 line corresponds to the region (source terminalportion) for forming the source terminal 52 and the source terminal pad53.

As seen from FIGS. 11 and 12, the TFT substrate 200 of the secondpreferred embodiment has almost the same configuration of the firstpreferred embodiment (FIGS. 2 and 3), but the TFT substrate 200 has alaminated structure including a semiconductor film 101 in the same layeras the semiconductor channel film 2 and a first insulating film 102 inthe same layer as the gate insulating film 31 also formed under the gatewires 41, the pixel electrode 7, the common electrode 9, the commonwires 91, the gate terminal 42, and the source terminal 52. In otherwords, the semiconductor film 101 being the material for thesemiconductor channel film 2 and the first insulating film 102 being thematerial for the gate insulating film 31 are located not only in the TFTportion but also under each component formed of the first conductivefilm or the second conductive film.

Next, a method for manufacturing the TFT substrate 200 according to thesecond preferred embodiment will be described with reference to FIGS. 13to 22. FIGS. 13 and 14 are process diagrams in plan view showing eachstep of the method for manufacturing the TFT substrate 200, and FIGS. 15to 22 are process diagrams in cross section showing each step of themethod for manufacturing the TFT substrate 200. FIGS. 13 and 14 are planviews corresponding to FIGS. 21 and 22, respectively. In these diagrams,components corresponding to those shown in FIGS. 11 and 12 are denotedby the same references.

First, the surface of the substrate 1 is cleaned with cleaning liquid orpure water. As shown in FIG. 15, a laminated film including thesemiconductor film 101 being the material for the semiconductor channelfilm 2, the first insulating film 102 being the material for the gateinsulating film 31, a first conductive film 103 and a second conductivefilm 104 being the materials for the gate electrode 4 and the pixelelectrode 7 laminated in the stated order is formed on the substrate 1that has been cleaned.

Also in this preferred embodiment similar to the first preferredembodiment, the InGaZnO film being the oxide semiconductor, the siliconoxide (SiO) film, the light-transmissive ITO film, and the Al-3 mol % Nifilm being the aluminum (Al) alloy are used for the semiconductor film101, the first insulating film 102, the first conductive film 103, andthe second conductive film 104, respectively. In addition, theirthicknesses and the method for forming them may be the same as those inthe first preferred embodiment.

Subsequently, a first photolithography step forms a photoresist pattern.First of all, a photoresist 110 made of novolac photosensitive resin ofthe positive type is formed on the laminated film including thesemiconductor film 101, the first insulating film 102, the firstconductive film 103, and the second conductive film 104 to have athickness of approximately 1.5 nm by a coating method. Then, as shown inFIG. 16, exposure is performed on the photoresist 110 with a photomask120.

The photomask 120 includes a light-shielding film formed in regionscorresponding to regions each forming the semiconductor channel film 2of the TFT 201, the gate electrode 4, the gate wires 41, the pixelelectrode 7, the common electrode 9, the common wires 91, the gateterminal 42, and the source terminal 52, and part of the light-shieldingfilm is a semi-transmissive film reducing light intensity of theexposure. Furthermore, the semi-transmissive film includes two kinds offilms having different transmittances. In other words, the photomask 120has transmissive regions T0 without the light-shielding film, a firstsemi-transmissive region T1 with the semi-transmissive film having thehigh transmittance, a second semi-transmissive region T2 with thesemi-transmissive film having the low transmittance, and alight-shielding region T3 with the light-shielding film that shieldslight (light transmittance of each region is in a relationship ofT0>T1>T2>T3). Thus, the intensity of the light that passes through thephotomask 120 has three levels.

Specifically, in the photomask 120, the portion corresponding to theregion for forming the semiconductor channel film 2 except for theregion for forming the gate electrode 4 is the first semi-transmissiveregion T1. The portions corresponding to the regions for forming thepixel electrode 7, the gate terminal 42, and the source terminal 52 arethe second semi-transmissive regions T2. Furthermore, the portionscorresponding to the regions for forming the gate electrode 4, the gatewires 41, the common electrode 9, and the common wires 91 are thelight-shielding regions T3. The other regions are the transmissiveregions T0. In other words, the transmissive regions T0 are disposedcorrespondingly to the regions from which all the four layers of thesemiconductor film 101, the first insulating film 102, the firstconductive film 103, and the second conductive film 104 are removed, thefirst semi-transmissive region T1 is disposed correspondingly to theregion in which the lowest two layers remain, the secondsemi-transmissive regions T2 are disposed correspondingly to the regionsin which the lowest three layers remain, and the light-shielding regionsT3 are disposed in the regions in which all of the four layers remain.

The photomask having many levels of the transmittances is referred to asa “half-tone mask,” and the exposure of the photoresist with thehalf-tone mask is referred to as a “half-tone exposure”.

After performing the half-tone exposure of the photoresist 110 with thephotomask 120 (half-tone mask), a development is performed with adeveloping solution of an organic alkali including a tetramethylammoniumhydroxide (TMAH). Consequently, the portions of the photoresist 110corresponding to the transmissive regions T0 of the photomask 120 areremoved while the portions of the photoresist 110 corresponding to thefirst semi-transmissive regions T1, the second semi-transmissive regionsT2, and the light-shielding regions T3 remain with the thicknessesaccording to the intensity of the transmitted light of each region.

Therefore, as shown in FIG. 17, the photoresist 110 is processed into aphotoresist pattern having three kinds of thicknesses. Specifically, thephotoresist 110 is processed into the photoresist pattern formed of athin first photoresist portion 111 that covers the region for formingthe semiconductor channel film 2 except for the region for forming thegate electrode 4, second photoresist portions 112 that are thicker thanthe first photoresist portion 111 and cover the regions for forming thepixel electrode 7, the gate terminals 42, and the source terminals 52,and third photoresist portions 113 that are thicker than the secondphotoresist portions 112 and cover the regions for forming the gateelectrode 4, the gate wires 41, the common electrode 9, and the commonwires 91. In this preferred embodiment, the thinnest first photoresistportion 111 has the thickness of 0.5 nm.

Next, as shown in FIG. 18, the second conductive film 104, the firstconductive film 103, the first insulating film 102, and thesemiconductor film 101 are successively removed by etching with thefirst photoresist portion 111, the second photoresist portions 112, andthe third photoresist portions 113 as masks. In this preferredembodiment, the second conductive film 104 (Al-3 mol % Ni film) isremoved by etching with a chemical solution of PAN, the first conductivefilm 103 (ITO film) is removed by etching with a chemical solution ofoxalic acid, the first insulating film 102 (SiO film) is removed by adry etching method with fluorine gas such as sulfur hexafluoride (SF₆)gas and O₂ gas, and the semiconductor film 101 (InGaZnO film) is removedby etching with the chemical solution of the oxalic acid again. Thisetching step forms the pattern of the semiconductor channel film 2formed of the semiconductor film 101 and the gate insulating film 31formed of the first insulating film 102.

Subsequently, the photoresist pattern is ashed with O₂ gas plasma toremove the first photoresist portion 111 and also to reduce thethicknesses of the second photoresist portions 112 and the thirdphotoresist portions 113 (the second photoresist portions 112 and thethird photoresist portions 113 remain). In other words, the photoresistpattern after the ashing has the two kinds of the thicknesses formed ofthe second photoresist portions 112 and the third photoresist portions113 in which their thicknesses have been reduced.

Then, as shown in FIG. 19, the second conductive film 104 and the firstconductive film 103 are successively removed by etching with the secondphotoresist portions 112 and the third photoresist portions 113 asmasks. Here, the second conductive film 104 (Al-3 mol % Ni film) is alsoremoved by etching with the chemical solution of the PAN, and the firstconductive film 103 (ITO film) is also removed by etching with thechemical solution of the oxalic acid.

This etching step forms each pattern for the gate electrode 4 (gateelectrode lower layer portion 4 a and gate electrode upper layer portion4 b), the gate wires 41 (gate wire lower layer portion 41 a and gatewire upper layer portion 4 b), the common electrode 9 (common electrodelower layer portion 9 a and common electrode upper layer portion 9 b),and the common wires 91 (common wire lower layer portion 91 a and commonwire upper layer portion 91 b), each of them having the laminatedstructure including the first conductive film 103 and the secondconductive film 104. At this point, each pattern for the pixel electrode7, the gate terminals 42, and the source terminals 52 are also formed,and the second conductive film 104 is in a state of remaining on thepixel electrode 7, the gate terminals 42, and the source terminals 52.

Next, the photoresist pattern is ashed again to remove the secondphotoresist portions 112 and also to reduce the thickness of the thirdphotoresist portions 113 (third photoresist portions 113 remain). Inother words, the photoresist pattern after the ashing is formed of onlythe third photoresist portions 113 in which the thickness has beenreduced.

Then, as shown in FIG. 20, the second conductive film 104 is removed byetching with the third photoresist portions 113 as a mask. Here, thesecond conductive film 104 (Al-3 mol % Ni film) is removed by etchingwith the chemical solution of the PAN. This etching step removes thesecond conductive film 104 remaining on the pixel electrode 7, the gateterminal 42, and the source terminal 52. Prior to the etching, thesubstrate 1 may be subjected to a heat treatment in temperatures greaterthan or equal to 150° C. In a case where the first conductive film 103is made of an oxide material, such as the ITO, the first conductive film103 may be slightly etched while the second conductive film 104 isetched with the chemical solution of the PAN. This can be prevented bythe heat treatment before the etching.

Subsequently, the third photoresist portions 113 are separated andremoved with a photoresist removing liquid of an amine. As a result, asshown in FIGS. 13 and 21, the semiconductor channel film 2, the gateinsulating film 31, the gate electrode 4, the gate wires 41, the pixelelectrode 7, the common electrode 9, the common wires 91, the gateterminal 42, and the source terminal 52 are formed.

In this manner, with the use of the half-tone technique, the only onephotolithography step can thus form the semiconductor channel film 2formed of the semiconductor film 101, the gate insulating film 31 formedof the first insulating film 102, the pixel electrode 7, the gateterminal 42, the source terminal 52, the gate electrode 4, the gatewires 41, the common electrode 9, and the common wires 91. The pixelelectrode 7, the gate terminal 42, and the source terminal 52 are formedof the first conductive film 103. The gate electrode 4, the gate wires41, the common electrode 9, and the common wires 91 are formed of thelaminated structure including the first conductive film 103 and thesecond conductive film 104.

However, the laminated film including the semiconductor film 101, thefirst insulating film 102, the first conductive film 103, and the secondconductive film 104 is needed to be patterned, so that the semiconductorfilm 101 and the first insulating film 102 cannot be removed from underthe components formed of the first conductive film 103 or the secondconductive film 104. Thus, the semiconductor film 101 and the firstinsulating film 102 are configured to remain under the gate wires 41,the pixel electrode 7, the common electrode 9, the common wires 91, thegate terminal 42, and the source terminal 52.

In this preferred embodiment, the first insulating film 102 and thesemiconductor film 101 are respectively formed of the light-transmissiveSiO film and InGaZnO film, so that even if the first insulating film 102and the semiconductor film 101 remain under the pixel electrode 7, thelight-transmissive properties of the image display portion are highlymaintained.

FIG. 23 is a diagram showing a result of measuring spectralcharacteristics of a transmittance of the oxide semiconductor film(InGaZnO film) used as the semiconductor film 101. The transmittance oflight decreases as a film thickness increases in principle (with theneed for considering an interference effect of light). In a visiblelight wavelength region (400 to 800 nm), it is clear that the InGaZnOfilm has the high transmittance of greater than or equal to 70% requiredfor a transmissive electrode up to the film thickness of at least 150nm, which includes the film thickness of 50 nm used in the secondpreferred embodiment.

On the other hand, the semiconductor film 101 is also a material for thesemiconductor channel film 2 of the TFT 201. If the semiconductorchannel film 2 has the thickness of less than 20 nm, the semiconductorchannel film 2 fails to function properly, so that the film thickness ispreferably at least greater than or equal to 20 nm Thus, thesemiconductor film 101 preferably has the thickness of greater than orequal to 20 nm and less than or equal to 150 nm in consideration of boththe function of the semiconductor channel film 2 and thelight-transmissive properties of the image display portion.

FIG. 23 also shows the result of measuring the spectral properties ofthe transmittance of the conventional Si semiconductor film having thethickness of 150 nm The Si semiconductor film has the low transmittance,so that if the Si semiconductor film is applied to the semiconductorfilm 101 of the preferred embodiment, the light transmittance of theimage display portion decreases. Thus, it can be said that the Sisemiconductor film is hardly applied to the semiconductor film 101 inthe transmissive TFT substrate 200 according to the preferredembodiment.

In the preferred embodiment, the first conductive film 103 (ITO film)and the second conductive film 104 (Al-3 mol % Ni film) are etched withthe chemical solution of the oxalic acid and the acid chemical solutionof the PAN, respectively. Upon the etching step, the gate insulatingfilm 31 formed of the first insulating film 102 (SiO film) covers thesemiconductor channel film 2 (InGaZnO film) for protection. Thisprevents the semiconductor channel film 2 from being etched, therebybeing kept in an excellent pattern shape.

Moreover, the first insulating film 102 forming the gate insulating film31 has the single-layer structure including the SiO film here, and thefirst insulating film 102 may have the laminated structure furtherincluding the insulating film provided on the SiO film. The upper layerof the insulating film may be the SiO film and may also be theinsulating film formed of the other material such as silicon nitride(SiN). It should be noted that the first insulating film 102 isconfigured to be located under the pixel electrode 7, so that in a caseof the transmissive TFT substrate 200, the upper layer of the insulatingfilm is needed to have the light-transmissive properties. The firstinsulating film has the laminated structure, allowing for the greatercoverage as a protective film.

The step after forming the semiconductor channel film 2, the gateinsulating film 31, the gate electrode 4, the gate wires 41, the pixelelectrode 7, the common electrode 9, the common wires 91, the gateterminal 42, and the source terminal 52 is similar to that of the firstpreferred embodiment. The first preferred embodiment requires the twophotolithography steps of forming each component mentioned above. Inthis preferred embodiment, the photolithography step has been performedonly once, which reduces one photolithography step.

In other words, the second insulating film is formed entirely on thesubstrate 1 so as to cover the semiconductor channel film 2, the gateinsulating film 31, the gate electrode 4, the gate wires 41, the pixelelectrode 7, the common electrode 9, the common wires 91, the gateterminal 42, and the source terminal 52, to thereby form the interlayerinsulating film 32. Then, the second photolithography step forms aphotoresist pattern, and the contact holes 11 to 16 are formed in theinterlayer insulating film 32 and the gate insulating film 31 by etchingwith the photoresist pattern as a mask, as shown in FIGS. 14 and 22.

Next, a laminated film including the third conductive film and thefourth conductive film laminated in the stated order is formed on theinterlayer insulating film 32. The third photolithography step forms aphotoresist pattern, and the third conductive film and the fourthconductive film are patterned by etching with the photoresist pattern asa mask, to thereby form the source electrode 5, the source wires 51, thedrain electrode 6, the counter electrode 8, the gate terminal pad 43,and the source terminal pad 53. The half-tone exposure technique is alsoapplied in this step, and thus the fourth conductive film is removedfrom each region for forming the drain electrode 6, the counterelectrode 8, the gate terminal pad 43, and the source terminal pad 53while the fourth conductive film remains in each region for forming thesource electrode 5 and the source wires 51.

As a result, the source electrode 5, the source wires 51, the drainelectrode 6, the counter electrode 8, the gate terminal pad 43, and thesource terminal pad 53 are formed, to thereby form the TFT substrate 200having the configuration shown in FIGS. 11 and 12. The half-toneexposure technique allows the source electrode 5 and the source wires 51to have the laminated structure including the third conductive film andthe fourth conductive film, and the half-tone exposure technique allowsthe drain electrode 6, the counter electrode 8, the gate terminal pad43, and the source terminal pad 53 to have the single-layer structureincluding the third conductive film.

In this manner, the TFT substrate 200 of the second preferred embodimentcan be formed in the three photolithography steps with greatproductivity.

Upon assembly of the liquid crystal display panel, the TFT substrate 200that has been completed includes the alignment film and the spacersformed on the surface thereof and includes the counter substrate thathas been formed separately bonded thereon. The liquid crystals areinjected into the gap in which the spacers create between the TFTsubstrate 200 and the counter substrate and are sealed, to thereby formthe liquid crystal display panel. In the end, the polarizing plate, thephase difference plate, and the backlight unit are disposed on the outerside of the liquid crystal display panel, to thereby complete the LCD ofthe FFS mode.

In the TFT substrate 200 of the first preferred embodiment, thesemiconductor channel film 2 of the TFT 201 is disposed in the lowestlayer, so that the light from the backlight unit is directly incident onthe semiconductor channel film 2. In a case where the semiconductorchannel film 2 is the Si film, ON/OFF ratio, which is one of TFTcharacteristics, may degrade due to photocarrier generation, but thedegradation in the ON/OFF ratio can be suppressed if the semiconductorchannel film 2 is made of the oxide semiconductor as in this preferredembodiment. Therefore, the liquid crystal display device having a highcontrast ratio and a high display quality without display unevenness canbe realized.

Moreover, the semiconductor channel film 2 made of the oxidesemiconductor allows for a high mobility of the TFT 201, whereby the TFTsubstrate 200 with high operation speed can be obtained. Therefore, theTFT can be reduced in size, and the aperture ratio of the image displayportion can be increased. In other words, a display at high luminance ispossible even with the reduced emitting light from the backlight unit,which can realize the LCD with reduced power consumption.

Modification of Second Preferred Embodiment

FIG. 24 is a cross-sectional view showing a TFT substrate 200 accordingto a modification of the second preferred embodiment. The firstpreferred embodiment described above exemplifies the transmissive TFTsubstrate 200 in which the light passes through the whole pixelelectrode 7. As shown in FIG. 24, a reflective pixel electrode 71 thatreflects light is provided in a fixed area on the pixel electrode 7,whereby the semi-transmissive TFT substrate 200 can also bemanufactured.

The reflective pixel electrode 71 is formed of the second conductivefilm 104 (metal film such as the Al-3 mol % Ni film), so that amanufacturing step is not increased. In other words, in the half-toneexposure (FIG. 16) of the first photolithography step, thelight-shielding region T3 may be provided on a portion corresponding tothe region for forming the reflective pixel electrode 71. Consequently,the thick third photoresist portion 113 is formed in the region, wherebythe first conductive film 103 serving as the reflective pixel electrode71 can remain on the corresponding portion of the pixel electrode 7.

Changing the area or the shape of the pattern of the reflective pixelelectrode 71 formed on the pixel electrode 7 can arbitrarily set theratio of the transmitted light and the reflected light of thesemi-transmissive electrode. Moreover, if the reflective pixel electrode71 is formed on almost the entire surface of the pixel electrode 7, thefull reflective TFT substrate 200 can be manufactured.

Third Preferred Embodiment

FIG. 25 is a plan view showing a configuration of a TFT substrateaccording to a third preferred embodiment. In the TFT substrate (FIG. 1)of the first and second preferred embodiments, the common wires 91 thatsupply the counter electrode 8 with the common voltage extend inparallel to the gate wires 41. In the third preferred embodiment, thecommon wires 91 extend in parallel to the source wires 51.

FIG. 26 is a diagram showing a planar configuration of a main partincluding the pixel 204 in the TFT substrate 200 according to the thirdpreferred embodiment, and FIG. 27 is a diagram showing a cross-sectionalconfiguration thereof. FIG. 27 shows corresponding cross sections takenalong an X1-X2 line, a Y1-Y2 line, and a Z1-Z2 line shown in FIG. 26. InFIGS. 26 and 27, the components having the same functions as thosedescribed in the first and second preferred embodiments (FIGS. 2, 3, 11,and 12) are denoted by the same references, which are not describedhere. The TFT substrate 200 has the whole configuration similar to thatin the first preferred embodiment (FIG. 1).

The cross section taken along the X1-X2 line in FIG. 27 corresponds tothe region (pixel portion) for forming the pixel 204 and includes the“TFT portion” that is the region for forming the TFT 201 and the “imagedisplay portion” that is the region for forming the pixel electrode 7and the counter electrode 8. The cross section taken along the Y1-Y2line corresponds to the region (gate terminal portion) for forming thegate terminal 42 and the gate terminal pad 43, and the cross sectiontaken along the Z1-Z2 line corresponds to the region (source terminalportion) for forming the source terminal 52 and the source terminal pad53.

As seen from FIGS. 26 and 27, the TFT substrate 200 of the thirdpreferred embodiment has the laminated structure including thesemiconductor film 101 in the same layer as the semiconductor channelfilm 2 and the first insulating film 102 in the same layer as the gateinsulating film 31 also formed under each of the components formed ofthe first conductive film 103 or the second conductive film 104, namely,under the gate wires 41, the pixel electrode 7, the gate terminal 42,and the source terminal 52.

Moreover, the common wires 91 that supply the counter electrode 8 withthe common voltage are integrally formed with the counter electrode 8using the third conductive film and are also connected to the counterelectrode 8 in the adjacent pixel in the vertical direction (extendingdirection of the source wires 51) of FIG. 26 across the gate wires 41.In other words, the counter electrodes 8 each in the pixels are coupledin the vertical direction through the common wires 91. That is to say,the counter electrode 8 functions as part of the common wires 91.

In such manner, the common wires 91 are formed in the layer differentfrom the layer of the pixel electrode 7, so that the pixel electrode 7can be formed in almost the entire region of the pixel portion. Thecommon wires 91 are integrally formed with the counter electrode 8,which eliminates the need to provide the common wires 91 used to connectthe counter electrode 8 to the common electrode 9 and also eliminatesthe need for the contact hole 14 (common electrode contact hole) for theconnection.

Next, a method for manufacturing the TFT substrate 200 according to thethird preferred embodiment will be described with reference to FIGS. 28to 31. FIGS. 28 and 29 are process diagrams in plan view showing eachstep of the method for manufacturing the TFT substrate 200, and FIGS. 30and 31 are process diagrams in cross section showing each step of themethod for manufacturing the TFT substrate 200. FIGS. 28 and 29 are planviews corresponding to FIGS. 30 and 31, respectively. In these diagrams,components corresponding to those shown in FIGS. 26 and 27 are denotedby the same references.

First, the surface of the substrate 1 is cleaned with cleaning liquid orpure water. A laminated film including the semiconductor film 101 beingthe material for the semiconductor channel film 2, the first insulatingfilm 102 being the material for the gate insulating film 31, and thefirst conductive film 103 and the second conductive film 104 being thematerials for the gate electrode 4 and the pixel electrode 7 laminatedin the stated order is formed on the substrate 1 that has been cleaned.

Also in this preferred embodiment similar to the first preferredembodiment, the InGaZnO film being the oxide semiconductor, the siliconoxide (SiO) film, the light-transmissive ITO film, and the Al-3 mol % Nifilm being the aluminum (Al) alloy are used for the semiconductor film101, the first insulating film 102, the first conductive film 103, andthe second conductive film 104, respectively. In addition, theirthicknesses and the method for forming them may be the same as those inthe first preferred embodiment.

Subsequently, the same method described with reference to FIGS. 15 to 21in the second preferred embodiment, namely, the first photolithographystep using the half-tone exposure technique forms a photoresist pattern.Then, a method that repeats etching with the photoresist pattern as amask and ashing (thickness reduction) of the photoresist patternpatterns the above-mentioned laminated film, to thereby form thesemiconductor channel film 2, the gate insulating film 31, the gateelectrode 4, the gate wires 41, the pixel electrode 7, the gate terminal42, and the source terminal 52 as shown in FIGS. 28 and 30. The gateelectrode 4 and the gate wires 41 have the laminated structure includingthe first conductive film 103 and the second conductive film 104, andthe pixel electrode 7, the gate terminal 42, and the source terminal 52have the single-layer structure including the first conductive film 103.Moreover, the semiconductor film 101 and the semiconductor film 102remain under the gate wires 41, the pixel electrode 7, the gate terminal42, and the source terminal 52.

The following step is almost the same as that of the second preferredembodiment. It should be noted that when the source electrode 5, thedrain electrode 6, the counter electrode 8, or the like is formed usingthe third conductive film, the common wires 91 are needed to beintegrally formed with the counter electrode 8. Moreover, the contacthole 14 (common electrode contact hole) is not formed.

In other words, the second insulating film is formed entirely on thesubstrate 1 so as to cover the semiconductor channel film 2, the gateinsulating film 31, the gate electrode 4, the gate wires 41, the pixelelectrode 7, the gate terminal 42, and the source terminal 52 after theformation thereof, to thereby form the interlayer insulating film 32.Then, the second photolithography step forms a photoresist pattern, andetching with the photoresist pattern as a mask forms the contact hole11, the contact hole 12, the contact hole 13, the contact hole 15, andthe contact hole 16 in the interlayer insulating film 32 and the gateinsulating film 31, as shown in FIGS. 29 and 31.

Next, a laminated film including the third conductive film and thefourth conductive film laminated in the stated order is formed on theinterlayer insulating film 32, the third photolithography step forms aphotoresist pattern, and the third conductive film and the fourthconductive film are patterned by etching with the photoresist pattern asa mask, to thereby form the source electrode 5, the source wires 51, thedrain electrode 6, the counter electrode 8, the common wires 91, thegate terminal pad 43, and the source terminal pad 53. The half-toneexposure technique is also applied in this step, and thus the fourthconductive film is removed from each region for forming the drainelectrode 6, the counter electrode 8, the common wires 91, the gateterminal pad 43, and the source terminal pad 53 while the fourthconductive film remains in each region for forming the source electrode5 and the source wires 51. In other words, the source electrode 5 andthe source wires 51 have the laminated structure including the thirdconductive film and the fourth conductive film while the drain electrode6, the counter electrode 8, the common wires 91, the gate terminal pad43, and the source terminal pad 53 have the single-layer structureincluding the third conductive film.

As a result, the TFT substrate 200 having the configuration shown inFIGS. 26 and 27 is formed. In this manner, the TFT substrate 200 of thethird preferred embodiment can be formed in the three photolithographysteps with great productivity.

Upon assembly of the liquid crystal display panel, the TFT substrate 200that has been completed includes the alignment film and the spacersformed on the surface thereof and includes the counter substrate thathas been formed separately bonded thereon. The liquid crystals areinjected into the gap in which the spacers create between the TFTsubstrate 200 and the counter substrate and are sealed, to thereby formthe liquid crystal display panel. In the end, the polarizing plate, thephase difference plate, and the backlight unit are disposed on the outerside of the liquid crystal display panel, to thereby complete the LCD ofthe FFS mode.

The TFT substrate 200 according to the third preferred embodiment canalso obtain the effects similar to those of the first and secondpreferred embodiments. The counter electrodes 8 each in pixels arecoupled to function as part of the common wires 91, which eliminates theneed to provide the common wires 91 in the lower layer (the same layeras the pixel electrode 7) unlike the first and second preferredembodiments. Thus, the pixel electrode 7 is formed in almost the entireregion of the pixel portion, whereby the area of the image displayportion can be increased. Consequently, the LCD of the FFS mode that isbrighter and has a high display quality can be realized. This enables adisplay at high luminance even with the reduced emitting light from thebacklight unit, which can also contribute to a reduction in powerconsumption.

Modification of Third Preferred Embodiment

FIG. 32 is a cross-sectional view showing a TFT substrate 200 accordingto a modification of the third preferred embodiment. As shown in FIG.32, the TFT substrate 200 of the third preferred embodiment includes thereflective pixel electrode 71 that reflects light provided in a fixedarea on the pixel electrode 7, whereby the semi-transmissive TFTsubstrate 200 can also be manufactured.

The reflective pixel electrode 71 is formed of the second conductivefilm 104 (metal film such as the Al-3 mol % Ni film), so that amanufacturing step is not increased. In other words, in the half-toneexposure of the first photolithography step, the light-shielding regionT3 may be provided on a portion corresponding to the region for formingthe reflective pixel electrode 71. Consequently, the thick thirdphotoresist portion 113 is formed in the region, whereby the firstconductive film 103 serving as the reflective pixel electrode 71 canremain on the corresponding portion of the pixel electrode 7.

Changing the area or the shape of the pattern of the reflective pixelelectrode 71 formed on the pixel electrode 7 can arbitrarily set theratio of the transmitted light and the reflected light of thesemi-transmissive electrode. Moreover, if the reflective pixel electrode71 is formed on almost the entire surface of the pixel electrode 7, thefull reflective TFT substrate 200 can be manufactured.

Fourth Preferred Embodiment

FIG. 33 is a diagram showing a planar configuration of a main partincluding the pixel 204 in a TFT substrate 200 according to a fourthpreferred embodiment, and FIG. 34 is a diagram showing a cross-sectionalconfiguration thereof. FIG. 34 shows corresponding cross sections takenalong an X1-X2 line, a Y1-Y2 line, and a Z1-Z2 line shown in FIG. 33.The TFT substrate 200 has the whole configuration similar to that in thefirst preferred embodiment (FIG. 1).

The cross section taken along the X1-X2 line in FIG. 34 corresponds tothe region (pixel portion) for forming the pixel 204 and includes the“TFT portion” that is the region for forming the TFT 201 and the “imagedisplay portion” that is the region for forming the pixel electrode 7and the counter electrode 8. The cross section taken along the Y1-Y2line corresponds to the region (gate terminal portion) for forming thegate terminal 42 and the gate terminal pad 43, and the cross sectiontaken along the Z1-Z2 line corresponds to the region (source terminalportion) for forming the source terminal 52 and the source terminal pad53.

In FIGS. 33 and 34, the components having the same functions as thosedescribed in the first and second preferred embodiments (FIGS. 2, 3, 11,and 12) are denoted by the same references, which are not describedhere.

The configuration of the TFT substrate 200 of the fourth preferredembodiment is similar to that of the second preferred embodiment (FIGS.11 and 12), but the pixel electrode 7 and the counter electrode 8 havethe configurations and positions opposite to those in the secondpreferred embodiment. In other words, the counter electrode 8 is a flatplate-shaped electrode formed of the first conductive film, and thepixel electrode 7 has a grid pattern formed of the third conductivefilm. The pixel electrode 7 is disposed on the counter electrode 8 toface the counter electrode 8 through the interlayer insulating film 32.

The common wires 91 that supply the counter electrode 8 with the commonvoltage are integrally formed with the counter electrode 8 using thefirst conductive film and are also connected to the counter electrode 8in the adjacent pixel in the horizontal direction (extending directionof the gate wires 41) of FIG. 33, the common wires 91 passing under thesource wires 51. In other words, the counter electrodes 8 each in thepixels are coupled in the horizontal direction through the common wires91. That is to say, the counter electrode 8 functions as part of thecommon wires 91.

In such manner that the counter electrode 8 is used as part of thecommon wires 91, the counter electrode 8 can be formed in almost theentire region of the pixel portion. The common wires 91 are integrallyformed with the counter electrode 8, which eliminates the need toprovide the common wires 91 used to connect the counter electrode 8 tothe common electrode 9 and also eliminates the need for the contact hole14 (common electrode contact hole) for the connection.

Meanwhile, the pixel electrode 7 is integrally formed with the drainelectrode 6 also formed of the third conductive film. This alsoeliminates the need for the contact hole 13 (pixel electrode contacthole) for connecting the pixel electrode 7 to the drain electrode 6.

The TFT substrate 200 of the fourth preferred embodiment similar to thesecond preferred embodiment (FIGS. 11 and 12) has the laminatedstructure including the semiconductor film 101 in the same layer as thesemiconductor channel film 2 and the first insulating film 102 in thesame layer as the gate insulating film 31 also formed under each of thecomponents formed of the first conductive film 103 or the secondconductive film 104, namely, under the gate wires 41, the counterelectrode 8, the common wires 91, the gate terminal 42, and the sourceterminal 52.

Next, a method for manufacturing the TFT substrate 200 according to thefourth preferred embodiment will be described with reference to FIGS. 35to 38. FIGS. 35 and 36 are process diagrams in plan view showing eachstep of the method for manufacturing the TFT substrate 200, and FIGS. 37and 38 are process diagrams in cross section showing each step of themethod for manufacturing the TFT substrate 200. FIGS. 35 and 36 are planviews corresponding to FIGS. 37 and 38, respectively. In these diagrams,components corresponding to those shown in FIGS. 33 and 34 are denotedby the same references.

First, the surface of the substrate 1 is cleaned with cleaning liquid orpure water. A laminated film including the semiconductor film 101 beingthe material for the semiconductor channel film 2, the first insulatingfilm 102 being the material for the gate insulating film 31, and thefirst conductive film 103 and the second conductive film 104 being thematerials for the gate electrode 4 and the counter electrode 8 laminatedin the stated order is formed on the substrate 1 that has been cleaned.

Also in this preferred embodiment similar to the first preferredembodiment, the InGaZnO film being the oxide semiconductor, the siliconoxide (SiO) film, the light-transmissive ITO film, and the Al-3 mol % Nifilm being the aluminum (Al) alloy are used for the semiconductor film101, the first insulating film 102, the first conductive film 103, andthe second conductive film 104, respectively. In addition, theirthicknesses and the method for forming them may be the same as those inthe first preferred embodiment.

Subsequently, the same method described with reference to FIGS. 15 to 21in the second preferred embodiment, namely, the first photolithographystep using the half-tone exposure technique forms a photoresist pattern.Then, a method that repeats etching with the photoresist pattern as amask and ashing (thickness reduction) of the photoresist patternpatterns the above-mentioned laminated film. It should be noted that thecounter electrode 8 is formed instead of the pixel electrode 7 using thefirst conductive film 103, and the common wires 91 extending in parallelto the gate wires 41 are integrally formed with the counter electrode 8.

Thus, as shown in FIGS. 35 and 37, the semiconductor channel film 2, thegate insulating film 31, the gate electrode 4, the gate wires 41, thecounter electrode 8, the common wires 91, the gate terminal 42, and thesource terminal 52 are formed. The gate electrode 4 and the gate wires41 have the laminated structure including the first conductive film 103and the second conductive film 104, and the counter electrode 8, thecommon wires 91, the gate terminal 42, and the source terminal 52 havethe single-layer structure including the first conductive film 103. Thesemiconductor film 101 and the semiconductor film 102 remain under thegate wires 41, the counter electrode 8, the common wires 91, the gateterminal 42, and the source terminal 52.

The following step is also almost the same as that of the secondpreferred embodiment. It should be noted that the pixel electrode 7 isformed instead of the counter electrode 8 using the third conductivefilm, and the pixel electrode 7 is needed to be integrally formed withthe drain electrode 6. The contact hole 13 (pixel electrode contacthole) and the contact hole 14 (common electrode contact hole) are notformed.

In other words, the second insulating film is formed entirely on thesubstrate 1 so as to cover the semiconductor channel film 2, the gateinsulating film 31, the gate electrode 4, the gate wires 41, the counterelectrode 8, the common wires 91, the gate terminal 42, and the sourceterminal 52 after the formation thereof, to thereby form the interlayerinsulating film 32. Then, the second photolithography step forms aphotoresist pattern, and etching with the photoresist pattern as a maskforms the contact hole 11, the contact hole 12, the contact hole 15, andthe contact hole 16 in the interlayer insulating film 32 and the gateinsulating film 31, as shown in FIGS. 36 and 38.

Next, a laminated film including the third conductive film and thefourth conductive film laminated in the stated order is formed on theinterlayer insulating film 32, the third photolithography step forms aphotoresist pattern, and the third conductive film and the fourthconductive film are patterned by etching with the photoresist pattern asa mask, to thereby form the source electrode 5, the source wires 51, thedrain electrode 6, the pixel electrode 7, the gate terminal pad 43, andthe source terminal pad 53. The half-tone exposure technique is alsoapplied in this step, and thus the fourth conductive film is removedfrom each region for forming the drain electrode 6, the pixel electrode7, the gate terminal pad 43, and the source terminal pad 53 while thefourth conductive film remains in each region for forming the sourceelectrode 5 and the source wires 51. In other words, the sourceelectrode 5 and the source wires 51 have the laminated structureincluding the third conductive film and the fourth conductive film whilethe drain electrode 6, the pixel electrode 7, the gate terminal pad 43,and the source terminal pad 53 have the single-layer structure includingthe third conductive film.

As a result, the TFT substrate 200 having the configuration shown inFIGS. 33 and 34 is formed. In this manner, the TFT substrate 200 of thefourth preferred embodiment can be formed in the three photolithographysteps with great productivity.

Upon assembly of the liquid crystal display panel, the TFT substrate 200that has been completed includes the alignment film and the spacersformed on the surface thereof and includes the counter substrate thathas been formed separately bonded thereon. The liquid crystals areinjected into the gap in which the spacers create between the TFTsubstrate 200 and the counter substrate and are sealed, to thereby formthe liquid crystal display panel. In the end, the polarizing plate, thephase difference plate, and the backlight unit are disposed on the outerside of the liquid crystal display panel, to thereby complete the LCD ofthe FFS mode.

The TFT substrate 200 according to the third preferred embodiment canobtain the effects similar to those of the first and second preferredembodiments. The counter electrode 8 is formed of the first conductivefilm and the counter electrodes 8 each in pixels are coupled to functionas part of the common wires 91, which eliminates the need toindividually provide the counter electrode 8 and the common wires 91.Thus, the counter electrode 8 is formed in almost the entire region ofthe pixel portion, whereby the area of the image display portion can beincreased. Consequently, the LCD of the FFS mode that is brighter andhas a high display quality can be realized. This enables a display athigh luminance even with the reduced emitting light from the backlightunit, which can also contribute to a reduction in power consumption.

Modification of Fourth Preferred Embodiment

FIG. 39 is a cross-sectional view showing a TFT substrate 200 accordingto a modification of the fourth preferred embodiment. As shown in FIG.39, the TFT substrate 200 of the fourth preferred embodiment includes areflective counter electrode 81 that reflects light provided in a fixedarea on the counter electrode 8, whereby the semi-transmissive TFTsubstrate 200 can also be manufactured.

The reflective counter electrode 81 is formed of the second conductivefilm 104 (metal film such as the Al-3 mol % Ni film), so that amanufacturing step is not increased. In other words, in the half-toneexposure of the first photolithography step, the light-shielding regionT3 may be provided on a portion corresponding to the region for formingthe reflective counter electrode 81. Consequently, the thick thirdphotoresist portion 113 is formed in the region, whereby the firstconductive film 103 serving as the reflective counter electrode 81 canremain on the corresponding portion of the counter electrode 8.

Changing the area or the shape of the pattern of the reflective counterelectrode 81 formed on the counter electrode 8 can arbitrarily set theratio of the transmitted light and the reflected light of thesemi-transmissive electrode. Moreover, if the reflective counterelectrode 81 is formed on almost the entire surface of the counterelectrode 8, the full reflective TFT substrate 200 can be manufactured.

The reflective counter electrode 81 also functions as part of the commonwires 91, so that a Al alloy film or a Ag (silver) alloy film having ahigh light-reflectance (greater than or equal to 70% in a visible lightregion of 400 nm to 800 nm) and a low electrical resistance (resistivityis less than or equal to 10 μΩm) is preferably used for the secondconductive film forming the reflective counter electrode 81.

As shown in FIG. 40, the second conductive film 104 remains on thecommon wires 91, and thus the common wires 91 have the laminatedstructure including the first conductive film 103 and the secondconductive film 104. Furthermore, the second conductive film 104 on thecommon wires 91 is also integrally formed with the reflective counterelectrode 81 such that the reflective counter electrodes 81 areconfigured to be coupled in the horizontal direction (extendingdirection of the gate wires 41). Consequently, the common wires 91 canhave a lower resistance and can be suitably applicable to a large panel.

This method can also be applicable to the common wires 91 of the thirdpreferred embodiment (FIGS. 26 and 27). In other words, if the fourthconductive film is located on the common wires 91 of the third preferredembodiment and the common wires 91 have the laminated structureincluding the third conductive film and the fourth conductive film, thecommon wires 91 can have a low resistance. This configuration can berealized if the thick portion of the photoresist pattern is formed inthe region for forming the common wires 91 upon the formation of thephotoresist pattern on the laminated film including the third conductivefilm and the fourth conductive film by the half-tone exposure.

Other Modifications

In the modifications of the first to fourth preferred embodiments above,the Al-3 mol % Ni film is used for the second and fourth conductivefilms, but this is not restrictive. For example, Cr, Ti, Mo, Ta, and Cuthat are well-known general metal films and these alloys can be widelyused. In the present invention, in a case where these metal films areprocessed by etching, the surface of the channel layer of the TFT iscovered with the first insulating film for protection. Thus, even in acase where these metal films are processed by etching with the acidchemical solution, the acid chemical solution does not expose thechannel layer unlike the conventional manner. Therefore, even in a casewhere the oxide semiconductor film having a poor resistance to the acidchemical solution is used for the channel layer of the TFT, the etchingdoes not destroy the channel layer. Therefore, the high-performance TFTsubstrate 200 including the oxide semiconductor film for the channellayer can be easily realized.

Moreover, the oxide semiconductor formed of the InGaZnO system is usedfor the semiconductor channel film 2, but this is not restrictive. Forexample, the other oxide semiconductor films, such as InZnO system,InGaO system, InSnO system, InSnZnO system, InGaZnSnO system, InAlZnOsystem, InHf (hafnium) ZnO system, InZr (zirconium) ZnO system, InMg(magnesium) ZnO system, InY (yttrium) ZnO system, and ZnSnO system, canbe used. In a case where these oxide semiconductor materials are used,effects similar to those of the oxide semiconductor film of the InGaZnOsystem in the preferred embodiments can be obtained.

Furthermore, a planarizing film made of resin may be applied as thesecond conductive film forming the interlayer insulating film 32. Forexample, FIG. 41 is a cross-sectional view showing a modification inwhich the planarizing film is applied to the interlayer insulating film32 in the TFT substrate 200 of the fourth preferred embodiment. Theupper surface of the interlayer insulating film 32 is a nearly flatsurface without a step, which can prevent the source electrode 5, thedrain electrode 6, and the counter electrode 8 (pixel electrode 7 in thefirst to third preferred embodiments) formed on the interlayerinsulating film 32 from breaking a wire in the step portion and canimprove manufacturing yields. The alignment surface having the liquidcrystals of the TFT-LCD that are arranged by the electric field (lateralelectric field) in a horizontal direction to the TFT substrate 200 canbe aligned, so that there is also an advantage that the displaycharacteristics having the high quality of the contrast can be obtained.

In addition, according to the present invention, the above preferredembodiments can be arbitrarily combined, or each preferred embodimentcan be appropriately varied or omitted within the scope of theinvention.

While the invention has been shown and described in detail, theforegoing description is in all aspects illustrative and notrestrictive. It is therefore understood that numerous modifications andvariations can be devised without departing from the scope of theinvention.

What is claimed is:
 1. An active matrix substrate, comprising: asubstrate; a thin film transistor formed on said substrate; a gate wireconnected to a gate electrode of said thin film transistor; a sourcewire connected to a source electrode of said thin film transistor; apixel electrode connected to a drain electrode of said thin filmtransistor; a counter electrode disposed opposite to said pixelelectrode; and a common wire supplying said counter electrode with aspecified voltage, wherein said thin film transistor includes: asemiconductor channel film that is formed on said substrate and isformed of a semiconductor film; a gate insulating film that is formed onsaid semiconductor channel film and is formed of a first insulatingfilm; said gate electrode that is formed of a laminated film including afirst conductive film and a second conductive film on said firstconductive film formed on said gate insulating film; an interlayerinsulating film that is formed on said semiconductor channel film, saidgate insulating film, and said gate electrode and is formed of a secondinsulating film; said source electrode that is formed of a laminatedfilm including a third conductive film and a fourth conductive film onsaid third conductive film formed on said interlayer insulating film andis connected to said semiconductor channel film through a contact holeformed in said interlayer insulating film and said gate insulating film;and said drain electrode that is formed of said third conductive filmand is connected to said semiconductor channel film through a contacthole formed in said interlayer insulating film and said gate insulatingfilm, said gate wire is formed of the laminated film including saidfirst conductive film and said second conductive film and is formed tobe connected to said gate electrode, said source wire is formed of thelaminated film including said third conductive film and said fourthconductive film and is formed to be connected to said source electrode,said pixel electrode is formed of said first conductive film and isconnected to said drain electrode through a contact hole formed in saidinterlayer insulating film, and said counter electrode is formed of saidthird conductive film and formed on said pixel electrode via saidinterlayer insulating film.
 2. The active matrix substrate according toclaim 1, wherein said common wire is formed of the laminated filmincluding said first conductive film and said second conductive film andis connected to said counter electrode through a contact hole formed insaid interlayer insulating film.
 3. The active matrix substrateaccording to claim 1, wherein said semiconductor film and said firstinsulating film exist under said gate wire and said pixel electrode. 4.The active matrix substrate according to claim 3, wherein said commonwire is formed of the laminated film including said first conductivefilm and said second conductive film and is connected to said counterelectrode through a contact hole formed in said interlayer insulatingfilm, and said semiconductor film and said first insulating film existunder said common wire.
 5. The active matrix substrate according toclaim 3, wherein said common wire is formed of said third conductivefilm and integrally formed with said counter electrode.
 6. The activematrix substrate according to claim 3, wherein said semiconductor filmis formed of a light-transmissive oxide semiconductor and has athickness of greater than or equal to 20 nm and less than or equal to150 nm.
 7. The active matrix substrate according to claim 1, furthercomprising: a gate terminal that is provided at an end portion of saidgate wire and is formed of said first conductive film; a gate terminalpad that is formed of said third conductive film and is connected tosaid gate terminal through a contact hole formed in said interlayerinsulating film; a source terminal that is provided at an end portion ofsaid source wire and formed of said first conductive film; and a sourceterminal pad that is formed of said third conductive film and isconnected to said source terminal through a contact hole formed in saidinterlayer insulating film.
 8. The active matrix substrate according toclaim 1, wherein said semiconductor film is formed of alight-transmissive oxide semiconductor, and said first conductive filmis formed of a light-transmissive conductive film.
 9. The active matrixsubstrate according to claim 1, wherein said counter electrode has agrid pattern or a comb pattern having slits.
 10. The active matrixsubstrate according to claim 1, wherein said second conductive film isformed of a metal film that reflects light, and a reflective pixelelectrode formed of said second conductive film is formed on at leastpart of said pixel electrode.
 11. An active matrix substrate,comprising: a substrate; a thin film transistor formed on saidsubstrate; a gate wire connected to a gate electrode of said thin filmtransistor; a source wire connected to a source electrode of said thinfilm transistor; a pixel electrode connected to a drain electrode ofsaid thin film transistor; a counter electrode disposed opposite to saidpixel electrode; and a common wire supplying said counter electrode witha specified voltage, wherein said thin film transistor includes: asemiconductor channel film that is formed on said substrate and isformed of a semiconductor film; a gate insulating film that is formed onsaid semiconductor channel film and is formed of a first insulatingfilm; said gate electrode that is formed of a laminated film including afirst conductive film and a second conductive film on said firstconductive film formed on said gate insulating film; an interlayerinsulating film that is formed on said semiconductor channel film, saidgate insulating film, and said gate electrode and is formed of a secondinsulating film; said source electrode that is formed of a laminatedfilm including a third conductive film and a fourth conductive film onsaid third conductive film formed on said interlayer insulating film andis connected to said semiconductor channel film through a contact holeformed in said interlayer insulating film and said gate insulating film;and said drain electrode that is formed of said third conductive filmand is connected to said semiconductor channel film through a contacthole formed in said interlayer insulating film and said gate insulatingfilm, said gate wire is formed of the laminated film including saidfirst conductive film and said second conductive film and is formed tobe connected to said gate electrode, said source wire is formed of thelaminated film including said third conductive film and said fourthconductive film and is formed to be connected to said source electrode,said pixel electrode is formed of said third conductive film and formedto be connected to said drain electrode, said counter electrode isformed of said first conductive film and formed under said pixelelectrode via said interlayer insulating film, and said common wire isformed of said first conductive film and integrally formed with saidcounter electrode.
 12. The active matrix substrate according to claim11, wherein said semiconductor film and said first insulating film existunder said gate wire, said counter electrode, and said common wire. 13.The active matrix substrate according to claim 12, wherein saidsemiconductor film is formed of a light-transmissive oxide semiconductorand has a thickness of greater than or equal to 20 nm and less than orequal to 150 nm.
 14. The active matrix substrate according to claim 11,further comprising: a gate terminal that is provided at an end portionof said gate wire and is formed of said first conductive film; a gateterminal pad that is formed of said third conductive film and isconnected to said gate terminal through a contact hole formed in saidinterlayer insulating film; a source terminal that is provided at an endportion of said source wire and is formed of said first conductive film;and a source terminal pad that is formed of said third conductive filmand is connected to said source terminal through a contact hole formedin said interlayer insulating film.
 15. The active matrix substrateaccording to claim 11, wherein said semiconductor film is formed of alight-transmissive oxide semiconductor, and said first conductive filmis formed of a light-transmissive conductive film.
 16. The active matrixsubstrate according to claim 11, wherein said counter electrode has agrid pattern or a comb pattern having slits.
 17. The active matrixsubstrate according to claim 11, wherein said second conductive film isformed of a metal film that reflects light, and a reflective commonelectrode formed of said second conductive film is formed on at leastpart of said counter electrode.